Direct Force Measurement with Reflective and Conductive Particles in Optical Tweezers

Isaac Cd Lenton,Timo A Nieminen,Peter J Reece,Alexander B Stilgoe,Halina Rubinsztein-Dunlop

2020 Conference on Lasers and Electro-Optics Pacific Rim (CLEO-PR)（2020）

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摘要

Direct force measurement produces unexpected results for conductive and reflective particles when scattered light is partially collected. With numerical simulations, we explain this phenomenon and describe measurement configurations which correctly estimate forces on these particles. © 2020 The Authors.

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关键词

direct force measurement,optical tweezers,conductive particles,reflective particles,measurement configurations,scattered light

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