Development of SEM Equipped with Superconductor X-ray Detector Toward Chemical State Nanoimaging for CFRP/adhesive Boundary

Journal Article Development of SEM Equipped with Superconductor X-ray Detector Toward Chemical State Nanoimaging for CFRP/adhesive Boundary Get access Go Fujii, Go Fujii National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki, Japan Search for other works by this author on: Oxford Academic Google Scholar Wenqin Peng, Wenqin Peng National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki, Japan Search for other works by this author on: Oxford Academic Google Scholar Masahiro Ukibe, Masahiro Ukibe National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki, Japan Search for other works by this author on: Oxford Academic Google Scholar Shigetomo Shiki, Shigetomo Shiki National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki, Japan Search for other works by this author on: Oxford Academic Google Scholar Naoko Yamazaki, Naoko Yamazaki Mitsubishi Heavy Industries, Ltd., Nagoya, Aichi, Japan Search for other works by this author on: Oxford Academic Google Scholar Koichi Hasegawa, Koichi Hasegawa Mitsubishi Heavy Industries, Ltd., Nagoya, Aichi, Japan Search for other works by this author on: Oxford Academic Google Scholar Kiyoka Takagi, Kiyoka Takagi Mitsubishi Heavy Industries, Ltd., Nagoya, Aichi, Japan Search for other works by this author on: Oxford Academic Google Scholar Masataka Ohkubo Masataka Ohkubo National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki, Japan Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 26, Issue S2, 1 August 2020, Pages 764–766, https://doi.org/10.1017/S1431927620015767 Published: 01 August 2020