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Investigation of Multi-Level Properties of TaOx-based Memristive Devices and Optimized Programming Scheme for On-Line Training

2020 China Semiconductor Technology International Conference (CSTIC)(2020)

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摘要
In this paper, we present the multi-level cell characteristics of TaO x based memristive devices as synaptic elements for neuromorphic computing. We utilized various programming conditions to modulate the conductance states with different set/reset voltage amplitude or width. Our results reveal that for LTP and LTD process, the dominant factors for write error are nonlinearity and fluctuation respectively. Furthermore, we proposed an error-aware programming scheme, thereby enabling a high accuracy for weight updating when used in ANN applications.
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关键词
nonlinearity,error-aware programming scheme,optimized programming scheme,on-line training,multilevel cell characteristics,memristive devices,synaptic elements,neuromorphic computing,programming conditions,conductance states,voltage amplitude,write error
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