Uv-Fluorescence Imaging Of Silicon Pv Modules After Outdoor Aging And Accelerated Stress Testing

Fast, non-destructive, outdoor-compatible methods for photovoltaic module characterization are essential for monitoring module quality without disrupting energy production. UV-fluorescence (UVF) imaging of the encapsulant layer can be used for solar cell crack detection in the field. We show that UVF patterns vary widely between modules and types of applied stress. We propose that combining accelerated stress testing (e.g. thermal cycling and damp heat) with field investigations can help build understanding of different types of UVF and the rates of UVF formation and quenching. Ultimately, further understanding could enable estimating the age and propagation rates of cracks.