Development Of Single Measurement Setup To Test S-Parameters And Distortions Of Microwave Devices

Distortions occurred due to the presence of nonlinearities in radio frequency and microwave circuits severely influence the performance of telecom industry. Most dominant of these distortions include harmonic and passive intermodulation distortion. To evaluate both of these distortions of any device-under-test (DUT) require separate complex measurement setup moreover, just after the fabrication of any DUT, it is mandatory to measure its S-parameters (S-par). Repetition of assembling and disassembling of DUT with the test set-ups introduce uncertainties in the measurement results; moreover, these tests consume a lot of time, human energy and decrease the life span of cables and connectors. In literature, few of the devices or measurement setups introduced to measurement the S-par & PIM, or S-par & HD. While, a comprehensive measurement set-up critically required to measure all these properties altogether without disconnecting the DUT. This research aims to develop high-quality test set-up to measure S-par, HD, and PIM circuits in a brief time.