Single-Event Transient Case Study for System-Level Radiation Effects Analysis

Michael J. Campola,Rebekah A. Austin,Edward P. Wilcox,Hak S. Kim,Raymond L. Ladbury,Kenneth A. La Bel,Jonathan A. Pellish

IEEE Transactions on Nuclear Science（2021）

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摘要

Analog single-event transient (SET) results are analyzed for two different applications within one system architecture. Application-specific analyses are presented on the MAX4595 commercial device using single-event effects criticality and goal structuring notation (GSN).

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关键词

Radiation,single-event effects (SEEs),single-event transients (SETs),system-level effects

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