Ion-Temperature Determination With A Baffled Langmuir Probe

An electrostatic Langmuir probe for real-time measurements of parameters in magnetized plasma is tested in fully ionized, barium, Q-machine plasma. The small-diameter, long-length, tungsten wire sensor, i.e., the probe tip, oriented with its cylindrical axis perpendicular to the magnetic field (B), is partially shielded by ceramic baffles, or masks, that form sensor-access slots between the baffles. Adjusting the azimuthal orientation of the slots, by rotating the probe about its cylindrical axis, changes the fraction of proximity gyro-orbiting electrons, relative to the fraction of proximity gyro-orbiting ions, that can access the recessed sensor along the magnetic field. Thus, the ratio between the electron and ion saturation currents, Iesat and Iisat, can be adjusted without having affected the probe bias voltage V-b. When optimally shielded (Iesat/Iisat=1), accurate, real-time measurements of space potential V-s can be acquired. When maximally shielded (Iesat/Iisat << 1), accurate, real-time measurements of ion temperature T-i can be acquired. Subtracting the floating potential V-f of an optimally shielded baffled probe from V-f of a maximally shielded baffled probe yields T-i (and its fluctuation phase) in real time.