谷歌浏览器插件
订阅小程序
在清言上使用

Comparing Standardized and Manufacturers’ Interfaces for Waveguides Used at Submillimeter Wavelengths

IEEE transactions on terahertz science and technology(2020)

引用 5|浏览1
暂无评分
摘要
This article presents a comparison between the specified dimensions given in document standards (IEEE Std 1785.2-2016) and the measured dimensions for interfaces used with rectangular metallic waveguides at submillimeter wavelengths. The standardized dimensions of these waveguide interfaces are compared with several waveguides in the WM-380 band (500-750 GHz) manufactured by two different companies. The measured electrical performance (in terms of reflection coefficient) for these waveguide interfaces is also compared with values given in documentary standards. The article shows that although the manufactured waveguides do not strictly adhere to the dimensions given in the standard, very good electrical performance is still achievable by using slightly different dimensions for the manufactured waveguide interfaces. The use of additional alignment dowel pins (as specified in the IEEE standard) further improves the electrical performance of these interfaces.
更多
查看译文
关键词
Pins,Position measurement,Electric variables measurement,Wavelength measurement,Rectangular waveguides,IEEE Standards,Rectangular waveguide,submillimeter-waves,terahertz,waveguide flanges,waveguide interfaces,waveguide standards
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要