Two-step preparation and characterization of ZnO Core–Si shell coaxial nanorods
JOURNAL OF THEORETICAL AND APPLIED PHYSICS(2020)
摘要
This study compares and analyzes the key characteristics of the ZnO core–Si shell coaxial nanorod (Si@ZnO NR) heterostructures that were grown on semi-insulating, (100)-oriented Si substrates at Si layer temperatures of 450, 500, 550 and 600 °C for optoelectronic device applications. The Si@ZnO NRs were prepared in two separate stages. Vapor-phase transport produced the ZnO NRs, whereas rapid thermal chemical vapor deposition formed the Si layers. Results obtained from X-ray diffraction, field emission scanning electron microscopy, energy-dispersive X-ray spectroscopy and Raman tests indicate that the ZnO NRs were single crystals with a zincblende configuration. The findings also reveal that the Si layer was polycrystalline in nature, poly-Si, with a würtzite configuration. The present research is beneficial to the optoelectronic devices such as light-emitting diodes, solar cells and photodetectors in the UV–infrared range using the Si@ZnO coaxial nanostructures.
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关键词
ZnO nanorod, Coaxial nanorod heterostructure, Si@ZnO NR, Chemical vapor deposition
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