Effects Of Temperature And Supply Voltage On Soft Errors For 7-Nm Bulk Finfet Technology

Integrated circuits are expected to operate across a wide range of temperatures and supply voltages. At the 7-nm FinFET technology node, the self-heating of individual transistors may further increase local temperatures on a die. The combined effects of supply voltage variations and elevated temperatures on soft-error rates for the 7-nm node are investigated. Results show increased sensitivity to soft errors at reduced supply voltage and elevated temperature conditions due to decreased charge collection.