Assessing Sicr Resistor Drift For Automotive Analog Ics
2021 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS)(2021)
摘要
A very stable resistor is needed for analog integrated circuits employed in harsh automotive environments. Precision SiCr thin-film resistors have been characterized by DC and pulsed I-V measurements, high-temperature operating life, and high temperature storage stress. Maximum current density for a maximum drift of 0.1% over the product lifetime are determined. Furthermore, SiCr resistors are stressed to failure and the physical failure mechanism is analyzed.
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关键词
SiCr resistor, resistance drift, safe-operating area
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