SEU Mechanisms in Spintronic Devices: Critical Parameters and Basic Effects

IEEE Transactions on Nuclear Science(2020)

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摘要
This article investigates radiation-induced switching mechanisms, temperature effects, breakdown voltage, sensitive volume, and critical charge definitions for spin-transfer torque magnetic tunnel junctions. The thermal spike model is adopted to estimate the temperature reached during heavy-ion irradiation, and temperature effects are suggested to be responsible for the magnetic properties' degradation and for upset processes.
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关键词
Linear energy transfer (LET),radiation effects,single-event upset (SEU),spin-transfer torque (STT)-MRAM,thermal effects,thermal spike model
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