Sequential focused ion beam scanning electron microscopy analyses for monitoring cycled-induced morphological evolution in battery composite electrodes. Silicon-graphite electrode as exemplary case

In the present work, an alternative to the standard ex-situ and destructive focused ion beam scanning electron microscopy (FIB/SEM) analysis procedure is demonstrated for monitoring the morphological degradation of a single Si/graphite (1/1 mass ratio) blended electrode for Li-ion batteries. For this purpose, a FIB milled microcavity is created in the pristine electrode, which is observed in FIB- polished cross section by SEM at different cycling periods (pristine, 1st, 9th and 50th cycles). This allows studying the same cycled electrode as for an in-situ method. Its cycling-induced morphological change is characterized at the electrode and particle scales by monitoring the evolution of the electrode thickness, mass and porosity, the Si particle morphology, Si interparticle distance, surface fraction and twisting of the graphite flakes. This is correlated to the evolution of the electrode discharge capacity and impedance. As a result, a more comprehensive view of the degradation phenomena of the Si/graphite blended electrode is established.