Testing Embedded Toggle Pattern Generation Through On-Chip IR Drop Monitoring

On-chip monitor (OCM) circuits capture dynamic power-supply (PS) waveforms within power domains individually bounded by dedicated micro voltage regulator modules (µVRMs). This paper uses OCM to diagnose VLSI circuits with a modular power management, where the evolution over time of the gate switching count, in the clock tree, the flip-flops, and the combinational logics are precisely captured in t...