The Multi-Optics High-Resolution Absorption X-Ray Spectrometer (Hiraxs) For Studies Of Materials Under Extreme Conditions

We report the development of a high-resolution spectrometer for extended x-ray absorption fine structure (EXAFS) studies of materials under extreme conditions. A curved crystal and detector in the spectrometer are replaceable such that a single body is employed to perform EXAFS measurements at different x-ray energy intervals of interest. Two configurations have been implemented using toroidal crystals with Ge 311 reflection set to provide EXAFS at the Cu K-edge (energy range 8.9-9.8 keV) and Ge 400 reflection set to provide EXAFS at the Ta L3-edge (9.8-10.7 keV). Key performance characteristics of the spectrometer were found to be consistent with design parameters. The data generated at the National Ignition Facility have shown an similar or equal to 3 eV spectral resolution for the Cu K-edge configuration and similar or equal to 6 eV for the Ta L3-edge configuration. Published under license by AIP Publishing.