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Mn Doped Multiferroic in Ga0.97Nd0.03FeO3electroceramics

Journal of Magnetism and Magnetic Materials(2021)SCI 3区

Veer Surendra Sai Univ Technol | Sambalpur Univ | Cent Univ Kerala | BIT Mesra | Natl Phys Lab

Cited 7|Views21
Abstract
GaFeO3 and (Ga0.97Nd0.03)(Fe1-xMnx)O3 (where x = 0.01-0.03)are synthesized by ceramic method. X-ray diffractometer (XRD), Field Emission Scanning Electron Microscope (FESEM), electrical properties (such as dielectric, impedance, modulus, and conductivity), P-E loop (polarization) and magnetic studies are carried out to investigate the structural, microstructural, electrical and multiferroic properties of the materials. The XRD peaks of all the specimens have pure phases with an orthorhombic crystal structure bearing Pc21n space group as obtained from the Rietveld refinement. Variation of dielectric constant with temperature represents that GaFeO3 and the doped samples exhibits dielectric anomaly well above the room temperature. It is also noticed that transition temperature increases with the increment of Mn content. The complex impedance plot exhibits two semicircles, which represents the presence of bulk and grain boundary effects. The modulus spectroscopy validates the existence of a non-Debye type of relaxation. P-E loop and PUND analysis at room temperature confirms the presence of weak ferroelectricity in the materials. However, ferroelectric property is enhanced with the increase of Mn content.
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Hysteresis,XRD,Dielectric,Impedance,Electrical Properties
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要点】:本研究通过陶瓷方法合成了Mn掺杂的多元铁电材料Ga0.97Nd0.03FeO3,探讨了其结构、微观结构、电学和铁电性,发现Mn掺杂可提高材料的铁电性能。

方法】:采用陶瓷方法合成了GaFeO3和(Ga0.97Nd0.03)(Fe1-xMnx)O3 (x = 0.01-0.03)样品,并通过X射线衍射仪(XRD)、场发射扫描电子显微镜(FESEM)、电学性质测试以及P-E环测量等手段研究了材料的结构、微观结构、电学和铁电性质。

实验】:通过XRD分析了样品的纯相正交晶体结构,并利用FESEM观察了微观结构。电学性质测试显示,材料的介电常数随温度变化呈现异常,且随Mn含量增加,转变温度提高。复阻抗谱显示了两个半圆,代表体效应和晶界效应。模量谱证明了非德拜型松弛的存在。室温下P-E环和PUND分析确认了材料中的弱铁电性,且铁电性质随Mn含量增加而增强。数据集名称未提及。