Redetermination the Basic Cell Trigonal Cr5Te8 Single Crystal Structure and Its Temperature Dependence Raman Spectra

Single crystal Cr5Te8 with basic trigonal cell was grown by the chemical vapor transport (CVT) method and the crystal structure was determined by single crystal X-ray diffraction. The as grown Cr5Te8 was crystallized in space group P-3m1 with a = 3.8972(11) angstrom and c = 5.9965(18) angstrom. Typical energy-dispersive x-ray spectra (EDS) suggesting the ratio of Cr and Te is around 38.5% and 61.5%. The electrical resistivity was measured by four-probe method at range from 2 to 350 K, and the result suggested an abnormal trend around 25 K. There is no evidence of structural transition through the Raman spectra collected at range from 8 to 325 K, which reveals the magnetic and electrical properties are independent of structural changes under low temperature. The Cr5Te8 crystal was expected as a potential magnetoelectric coupling material, considering the magnetic transition around 20 K.