Method of fluorescent plate electron beam imaging system for calibrating electric power response of high energy electron beam

The invention discloses a method of a fluorescent plate electron beam imaging system for calibrating the electric power response of high energy electron beam. The method comprises the steps of: covering an electron incident surface of a fluorescent plate of the imaging system with an electronic imaging plate, filtering out low energy electrons in a high-energy large-divergence angle electron beamwith continuously distributed spectra through an aluminum plate, and simultaneously irradiating the electron beam on the electronic imaging plate and the fluorescent plate, recording, by a CCD (Charge-Coupled Device) detector, the count values of the electron beam traveling a same area on the electronic imaging plate and on the fluorescent plate; and acquiring the information of the electric power through the known electronic imaging plate in order to determine the corresponding relation between the count value of the fluorescent plate and the electric power. By using the method, simple electric power response calibration can be performed on the fluorescent plate electron beam imaging system in a laser wakefield acceleration experiment without requiring a standard electron beam source.