RT XFEL structure of Photosystem II 150 microseconds after the second illumination at 2.5 Angstrom resolution
J. Kern,R. Chatterjee,I.D. Young,F.D. Fuller,L. Lassalle,M. Ibrahim,S. Gul,T. Fransson,A.S. Brewster,R. Alonso-Mori,R. Hussein,M. Zhang, L. Douthit,C. de Lichtenberg,M.H. Cheah, D. Shevela, J. Wersig, I. Seufert, D. Sokaras,E. Pastor,C. Weninger,T. Kroll, R.G. Sierra, P. Aller, A. Butryn,A.M. Orville,M. Liang,A. Batyuk, J.E. Koglin,S. Carbajo, S. Boutet,N.W. Moriarty,J.M. Holton,H. Dobbek,P.D. Adams,U. Bergmann,N.K. Sauter,A. Zouni,J. Messinger,J. Yano,V.K. Yachandra user-6073b1344c775e0497f43bf9（2018）
关键词
Resolution (electron density),Photosystem II,Microsecond,Optics,Materials science,Angstrom
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