RT XFEL structure of the dark-stable state of Photosystem II (0F, S1-rich) at 2.05 Angstrom resolution
J. Kern,R. Chatterjee,I.D. Young, F.D. Fuller, L. Lassalle,M. Ibrahim,S. Gul, T. Fransson, A.S. Brewster, R. Alonso-Mori,R. Hussein,M. Zhang, L. Douthit, C. de Lichtenberg, M.H. Cheah, D. Shevela, J. Wersig, I. Seufert, D. Sokaras,E. Pastor,C. Weninger,T. Kroll, R.G. Sierra, P. Aller, A. Butryn, A.M. Orville,M. Liang, A. Batyuk, J.E. Koglin, S. Carbajo, S. Boutet, N.W. Moriarty, J.M. Holton, H. Dobbek,P.D. Adams,U. Bergmann,N.K. Sauter, A. Zouni, J. Messinger,J. Yano, V.K. Yachandra user-6073b1344c775e0497f43bf9（2018）
关键词
Resolution (electron density),Photosystem II,Crystallography,Materials science,Angstrom,Stable state
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