Validating a DFT Strategy’s Detection Capability regarding Emerging Faults in RRAMs

Over the last fifty years, Complementary Metal Oxide Semiconductor (CMOS) technology has been scaled down according to the predictions made by Gordon Moore in the 1960s, hence making the design of high-performance applications possible. However, there is a growing concern that device scaling will become infeasible below a certain feature size. In parallel, emerging applications present high demand...