Experimental Equipment Design and Setup for Measuring Electronic Devices under Magnetic Fields

This work proposes a complete equipment and setup solution for testing of non-encapsulated electronic devices under moderate magnetic fields. The equipment was implemented, tested and used to characterize three different MOS transistor topologies, especially designed for magnetic field susceptibility evaluation. The probe station with the proposed solution, allows the measurement of devices with quality and repeatability from 0 to 330mT.