A Novel Atomic Layer Deposited Al2o3 Film With Diluted Nh4oh For High-Efficient C-Si Solar Cell
JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE(2014)
摘要
In this paper, Al2O3 film deposited by thermal atomic layer deposition (ALD) with diluted NH4OH instead of H2O was suggested for passivation layer and anti-reflection (AR) coating of the p-type crystalline Si (c-Si) solar cell application. It was confirmed that the deposition rate and refractive index of Al2O3 film was proportional to the NH4OH concentration. Al2O3 film deposited with 5 % NH4OH has the greatest negative fixed oxide charge density (Q(f)), which can be explained by aluminum vacancies (V-Al) or oxygen interstitials (O-i) under O-rich condition. Al2O3 film deposited with NH4OH 5 % condition also shows lower interface trap density (D-it) distribution than those of other conditions. At NH4OH 5 % condition, moreover, Al2O3 film shows the highest excess carrier lifetime (tau(PCD)) and the lowest surface recombination velocity (S-eff), which are linked with its passivation properties. The proposed Al2O3 film deposited with diluted NH4OH is very promising for passivation layer and AR coating of the p-type c-Si solar cell.
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关键词
Solar cell, Al2O3, NH4OH, passivation layer, anti-reflection coating
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