Layup-Only Modulization For Low-Stress Fabrication Of A Silicon Solar Module With 100 Mu M Thin Silicon Solar Cells

SOLAR ENERGY MATERIALS AND SOLAR CELLS(2021)

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摘要
Despite the predominance of solar modules with bulk crystalline silicon solar cells as a result of their high photoconversion efficiency, long-lasting durability, and low cost per electrical watt, the competitive market has elevated the necessity of thinner silicon solar cells to further reduce direct material costs. However, the tabbing and stringing process using high melting temperature soldering in the conventional fabrication method of a silicon solar module is required to alternatingly interconnect adjacent silicon solar cells, which entails significant thermomechanical stress. The lifting up-and-down motions in the layup process of serially stringed silicon solar cells also lead to an unfavourable interfacial stress between metal ribbons and silicon solar cells. Consequently, a considerably poor yield of silicon solar modules with the unbearable breakage loss of thin silicon solar cells is ascribed to such processes. Herein, an innovative solution to interconnect thin silicon solar cells through virtually no thermomechanical stress is proposed by using encapsulants pre-attached with low melting temperature metal ribbons at 139 degrees C, which allow the interconnection of pre-laid silicon solar cells in the course of the vacuum lamination at 160 degrees C. The resulting silicon solar modules exhibit a photoconversion efficiency of 19.1 +/- 0.1%, which represents 99.9 +/- 0.6% of the benchmark photoconversion efficiency of conventional silicon solar modules. The presented layup-only modulization succeeds in fabricating silicon solar modules with 100 mu m thin silicon solar cells and it is anticipated to curtail the breakage loss of thin silicon solar cells as well as elevate fabrication productivity by simplifying the fabrication steps of silicon solar modules.
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关键词
Silicon solar module, Thin silicon solar cell, Thermal shock, Thermomechanical stress, Interfacial stress, Low-stress interconnection
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