A Reliability-Concerned Compute-in-Memory Behavior Model for Convolutional Neural Network
2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)(2021)
摘要
A reliability-concerned compute-in-memory (CIM) behavior model is developed to evaluate and optimize the performance of convolutional neural network (CNN), like LeNet, VGG. Non-ideal factors, such as cell delay variation and mismatch are concerned as parameters in image classification tasks. The inference accuracy will be evaluated under specific dataset, neural network architecture, mapping metho...
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关键词
Training,Computational modeling,Microprocessors,Neural networks,Computer architecture,Reliability engineering,Delays
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