Self-Learning based Highly Efficient Sampling Strategy for Complex Surface Reconstruction on Contact Measurements
2021 3rd International Conference on Industrial Artificial Intelligence (IAI)(2021)
摘要
Contact measurements are significant for surface metrology and can provide highly precise results. However, the point-by-point touch sampling process is less efficient, which seriously limits their applications in manufacture process, especially for the measurement of multi-scale complex workpieces. On the other hand, the lack of high-quality labeled datasets in manufacturing industries prevents a...
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