Self-Learning based Highly Efficient Sampling Strategy for Complex Surface Reconstruction on Contact Measurements

2021 3rd International Conference on Industrial Artificial Intelligence (IAI)(2021)

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摘要
Contact measurements are significant for surface metrology and can provide highly precise results. However, the point-by-point touch sampling process is less efficient, which seriously limits their applications in manufacture process, especially for the measurement of multi-scale complex workpieces. On the other hand, the lack of high-quality labeled datasets in manufacturing industries prevents a...
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