Testing and trimming methods of high-resolution and large swing for ADC based on ATE

Liran Li,Pengcheng Xiao,Zhenhai Lu,YuBo Wang, Yi Hu,Yuan Guan, Kun Wang,Dameng Li, Fan Zhang

2021 IEEE 14th International Conference on ASIC (ASICON)（2021）

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摘要

In this paper, a test and trim method for a high-resolution ADC with large swing is presented, which is based on ADVANTEST V93000 ATE. In order to reduce the test cost, a high resolution and large swing test signal generation circuit is designed. The test results show that the signal generation circuit can generate Ramp wave and Sine wave with peak-to-peak value of 29V, with THD better than -103dB...

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关键词

Costs,Photonic band gap,Conferences,Signal resolution,Testing,Signal to noise ratio

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