Two dynamic modes to streamline challenging atomic force microscopy measurements

The quality of topographic images obtained using atomic force microscopy strongly depends on the accuracy of the choice of scan-ning parameters. When using the most common scanning method - semicontact amplitude modulation (tapping) mode, the choice of scanning parameters is quite complicated, since it requires taking into account many factors and finding the optimal balance be-tween them. A researcher's task can be significantly simplified by introducing new scanning techniques. Two such techniques are described: vertical and dissipation modes. Significantly simplified and formalized choice of the imaging parameters in these modes allows addressing a wide range of formerly challenging tasks - from scanning rough samples with high aspect ratio features to mo-lecular resolution imaging.