Reliability Evaluations of SiCr Resistors in BCD IC Technologies

M. Ring,K.A. Stewart, R.C. Jerome,A. Hasegawa,J.P. Gambino, D.T. Price

2021 IEEE International Integrated Reliability Workshop (IIRW)（2021）

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摘要

Silicon-Chromium (SiCr) precision resistors are a stable alternative to poly-silicon resistors for use in power analog and automotive products. The reliability of these resistors is dependent upon the composition, applied power, and other factors. Determining the resistor failure mechanism is difficult due to Joule Heating, and a pulsed current stress test has been used to determine the safe opera...

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关键词

Resistors,Integrated circuits,Heating systems,Electromigration,Power system measurements,Temperature,Failure analysis

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