Performance Analysis of a Double-Gate Junctionless Transistor with Varied Doping and Gate Underlap using Device Simulator

2021 IEEE International Conference on Sensors and Nanotechnology (SENNANO)(2021)

引用 1|浏览1
暂无评分
摘要
In this work, the impact of doping concentrations and gate underlap towards the electrical performance of a double-gate junctionless transistor (DG-JLT) were investigated using three-dimensional device simulator. The results show that the parameter of doping concentrations (Nd) has a greater impact towards the electrical performance of the transistor as compared to the gate underlap len...
更多
查看译文
关键词
Performance evaluation,Doping,Logic gates,Electric variables,Sensors,Performance analysis,Transistors
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要