The Study of SEM Examination of Crept Ceramic Samples Prepared by Cross Polishing Method

Creep performance of a material is one of the major factors for determining its high temperature application. The determination of creep performance of a material is generally accomplished by experimental studies. In experimental creep studies, creep testing and microstructural analysis are used to determine the active creep mechanisms of materials being investigated. There are many cases where microstructural observation of a cross section is important and necessary. Scanning electron microscopy observation of flexure creep tested specimens is one of those cases. Cross section polishing method is one of the methods used for cross section sample preparation. In this study, microstructure of crept ceramics prepared by cross section polishing method was investigated by using scanning electron microscope. Keywords— SiAlON ceramics; scanning electron microscopy; cross section polishing; Sample Preparation;