Corrigendum to “Focused ion beam-based microfabrication of boron-doped diamond single-crystal tip cantilevers for electrical and mechanical scanning probe microscopy”. [Measurement 188 (2022) 110373]

•The application of a focused electron and ion beam to deposit diamond particle.•Determination of the cantilever mass change by thermomechanical noise analysis.•Single-crystal boron-doped diamond tip usage as measuring probes.•High aspect ratio tip formation enabled by focused ion beam.•Conductive diamond tip reliability in scanning probe microscopy measurements.