An Analytical Frequency-Dependent Capacitance-Voltage Model for Metal Oxide Thin-Film Transistors

Kai Xiang,Hao-Yang Li,Fei-Fan Li,Hua Xu,Lei Zhou,Miao Xu,Lei Wang,Wei-Jing Wu,Jun-Biao Peng

IEEE Transactions on Electron Devices（2022）

引用 2|浏览15

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摘要

Based on the static capacitance-voltage ( ${C}-{V}$ ) model, a new analytical frequency-dependent ${C}-{V}$ model of thin-film transistors (TFTs) is derived from a modified transmission line method (TLM), which is built by embedding an equivalent circuit c...

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关键词

Electron traps,Thin film transistors,Capacitance,Logic gates,Transmission line measurements,Equivalent circuits,Time-varying systems

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