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Effects of Structural Variation for Improved Performance of a Vertical AlGaN/GaN Superjunction HEMT

2021 5th International Conference on Electrical Engineering and Information & Communication Technology (ICEEICT)(2021)

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摘要
A GaN-based vertical superjunction high electron mobility transistor (HEMT) is analyzed theoretically to improve specific on-resistance $(\mathrm{R}_{\text{on}})$ and breakdown voltage (BV). The Drain is vertically aligned with the Source and Gate in a vertical superjunction HEMT, where the width is divided into two pillars, p and n. Each of these pillars is referred to as a half pillar. The devic...
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关键词
Simulation,Doping,HEMTs,Logic gates,Communications technology,Wide band gap semiconductors,MODFETs
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