Single Event Latchup (SEL) and Single Event Upset (SEU) Evaluation of Xilinx 7nm Versal™ ACAP programmable logic (PL)

Pierre Maillard,Yanran P. Chen,Jeff Barton,Martin L. Voogel

2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)（2021）

引用 5|浏览1

暂无评分

摘要

this paper examines the single-event latchup (SEL) and single event upset (SEU) response of the Xilinx 7nm XCVC1902 ES1 Versal ACAP Programmable Logic irradiated with neutrons and 64 MeV protons sources. No SEL was observed in the entire Xilinx 7nm XCVC1092 for worst case conditions. Furthermore, The SEU response for single-event upsets on configuration RAM (CRAM) cells, block RAM (BRAM) and block...

查看译文

关键词

Xilinx 7nm,Versal ACAP,Kintex,SEUs,SEL

AI 理解论文

溯源树

样例

生成溯源树，研究论文发展脉络

Chat Paper

正在生成论文摘要