Super-resolution using speckle illumination microscopy

Awoke Negash,Thomas Mangeat,Simon Labouesse,Hugues Giovannini,Kamal Belkebir,Patrick C. Chaumet,Nicolas Sandeau,Renaud Poincloux,Anais Bouïssou,Anne Sentenac

Imaging and Applied Optics 2017 (3D, AIO, COSI, IS, MATH, pcAOP)（2017）

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摘要

Using a dedicated separate-deconvolution scheme on low-resolution images obtained from a fast speckle illumination setup, we obtain resolution enhancement of more than 2.3 times beyond the diffraction limit. We also present a slice-based deconvolution approach which reduces the out-of-focus blur.

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