Trapped charge modulation at the MoS2/SiO2 interface by a lateral electric field in MoS2 field-effect transistorsJinsu Pak,Kyungjune Cho,Jae-Keun Kim,Yeonsik Jang,Jiwon Shin,Jaeyoung Kim,Junseok Seo,Seungjun Chung,Takhee LeeNano Futures(2019)引用 12|浏览0暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要