Precise determination of polarization fields in c-plane GaN/Al x Ga1-x N/GaN heterostructures with capacitance–voltage-measurementsNorman Susilo,Marcel Schilling,Michael Narodovitch, Hsin-Hung Yao,Xiaohang Li,Bernd Witzigmann,Johannes Enslin,Martin Guttmann,Georgios G. Roumeliotis,Monir Rychetsky,Ingrid Koslow,Tim Wernicke,Tore Niermann,Michael Lehmann,Michael KneisslJapanese Journal of Applied Physics（2019）引用 3|浏览3暂无评分AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
