Low‐to‐Mid Al Content ( x = 0–0.56) Al x In 1− x N Layers Deposited on Si(100) by Radio‐Frequency SputteringRodrigo Blasco,Sirona Valdueza-Felip,Daniel Montero,Michael Sun,Javier Olea,Fernando B. Naranjophysica status solidi (b)(2020)引用 5|浏览1暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要