Characterization of the reflectivity of various black and white materials

Luke M. Schmidt,Lauren N. Aldoroty,Yasin Alam,Leonardo Bush,Darren L. DePoy, Matthew Holden,Doyeon Kim, Jennifer L. Marshall, Mason Perkey

Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation IV（2020）

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摘要

We report on an expanded catalog of total reflectance measurements of various common (and uncommon) materials used in the construction and/or baffling of optical systems. Total reflectance is measured over a broad wavelength range (250 nm < λ <2500 nm) that is applicable to ultraviolet, visible, and near-infrared instrumentation.

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关键词

optical instrumentation, infrared instrumentation, scattered light, stray light, black materials, white materials, calibration screens, reflectivity

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