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A new approch to detect N400 event-related potentials in giftedness children

2020 4th International Conference on Advanced Systems and Emergent Technologies (IC_ASET)(2020)

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摘要
The diagnosis of gifted children (GC) is still a challenge for a better control of their skills. In this paper, a study is reported that use simple epochs from an electrophysiological experiment (electroencephalogram, EEG) combined with a mathematical method in order to analyze the evoked potentials of gifted children. This study is based on the N400'component extraction which is flooded in the background noise by the Integral Shape Averaging method. A comparing study is done between Synchronous Signal Averaging and the proposed method to show that decreasing the number of sequences trials with ISA give a clear ERP.
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关键词
EEG,evoked potentials,gifted children,N400 component,background noise,Integral Shape Averaging,Synchronous Averaging
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