Development of shape measurement system for high precision Wolter mandrel

Advances in Metrology for X-Ray and EUV Optics IX(2020)

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摘要
Since a replication-type of the Wolter mirror is obtained as the negative shape of its mandrel via shape replication represented by electroforming, a high precision mandrel fabrication process is essential for nano-focusing with the mirror at synchrotron radiation facilities. In particular, three-dimensional shape measurement technique for the mandrel is required. In this study, we developed the high precision three-dimensional shape measurement system dedicated for the Wolter mandrels. First, the shape error distributions of the ellipsoidal surface and the hyperboloid surface were measured independently. The geometrical relation between the surfaces was constrained by the longitudinal profiles which include the intersection measured by a profilometer. The diameter was also measured and finally the three-dimensional shape distribution was obtained. Applying this system, we fabricated a high precision Wolter mandrel.
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