Fabrication and analysis of speckle masks for optimal system design in higher energy speckle-based XPCI

Speckle-based X-ray phase contrast imaging (XPCI) is a relatively simple implementation of phase contrast imaging. At low energies, the technique has been demonstrated with masks made from steel wool and sandpaper. However, these materials are too transparent for higher energy applications. The simple geometry and easy identification of, or fabrication of, materials for relevant speckle masks make speckle-based XPCI a compelling technique for widespread use. We have analyzed the trade space for higher energy speckle-based XPCI systems based on portable X-ray tube sources. We have demonstrated several fabrication techniques compatible with a range of materials. Together these enable variation in feature size, material density, and randomness in the mask. This ability to tune the mask parameters allows optimization of the mask for the application space and system design.