Thermal imaging in the 3-5 micron range for precise localization of defects: application on frescoes at the Sforza Castle

Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series(2021)

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摘要
Infrared methods are of great importance in nondestructive testing of artworks, allowing a remote and wide-field imaging of interesting hidden features. Here we discuss a workflow based on thermal imaging in the mid infrared 3-5 micron range for the evaluation of subsurface defects in frescoes. Particular attention is payed to obtaining a high resolution (submillimetric) localization of the defects. The transfer of diagnostics techniques into real world applications, is discussed through the proof of concept of the proposed workflow on frescoes at the Sforza Castle (Milan, Italy).
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