Magnetic and DC Electrical Resistivity Properties of Cu doped Mg0.6-xNi0.4CuxFe2O4 Ferrite

Cu doped Mg0.6-xNi0.4CuxFe2O4 (x = 0.0, 0.1, 0.2 and 0.3) ferrite materials with spinel structure have been prepared by solid-state reaction method.  For their characterization, we have used X-ray diffraction (XRD) to examine structural parameters, Scanning electron microscopy (SEM) with EDS to study morphology and composition, Fourier transform infrared spectroscopy (FTIR) to identify the characteristics absorption bands, Vibrating sample magnetometer (VSM) to deal with magnetic parameters, and Two-probe measurement technique for DC resistivity.  The XRD pattern and two definite absorption bands given by FTIR in between 400 cm−1 - 600 cm−1 revealed a single-phase cubic spinel structure formation of the synthesized materials. The increment in Cu concentration increased the lattice constant as a result of the larger ionic radius of this substituent than that of Mg ion. The distribution of cations to the octahedral and tetrahedral positions affects the hopping mechanisms that ultimately influence the features related to resistivity and magnetism. Keywords- Cu substitute Mg-Ni ferrite; X-ray diffraction; Vibrational Spectrometer; SEM; VSM.