Statistical Analysis of Droplet Epitaxal Nano-structure Growth Parameters - as Preliminary for Technological Support

2020 IEEE 3rd International Conference and Workshop in Óbuda on Electrical and Power Engineering (CANDO-EPE)(2020)

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摘要
A literature-based database has been investigated in order to establish strategic roadmap for nanostructure technology. Practically this is carried out by finding relationship between technology parameters and geometric properties of nanostructures produced by droplet epitaxial process. The crucial point is to deal with high-dimensionality of both technological and geometrical parameters of nanostructures. Principal component analysis and regression were used. Geometrical parameters were substituted with analytical fitting ones. Soft computing methods were also applied to find abovementioned relationships.
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关键词
droplet epitaxy,quantum dot,principal component analysis,multivariate regression
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