Influence of misfit strain on the physical properties of Fe thin films

Anna L. Ravensburg,Gunnar K. Pálsson,Merlin Pohlit,Björgvin Hjörvarsson,Vassilios Kapaklis

Thin Solid Films（2022）

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摘要

We investigate the growth of thin Fe layers on MgAl2O4 (001) and MgO (001) substrates using dc magnetron sputtering. The crystal quality of Fe layers deposited on MgAl2O4 is found to be substantially higher as compared to Fe grown on MgO substrates. The effects of the crystal quality on the magnetic and electronic transport properties are discussed.

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关键词

Thin film growth,Crystal quality,X-ray diffraction,Electronic transport,Magnetism,Critical thickness,Strain

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