Investigation of FPGA and SRAM Cells Under Radiation Exposure

Kirsten Weide-Zaage,Guillermo Paya-Vaya,Katharina Schmidt, Dorian Hagenah

2022 23rd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)（2022）

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摘要

Basically, every human as well as electronical equipment on earth, is naturally exposed to ionizing radiation. This may lead to unwanted failures, especially in microelectronic devices. This becomes more severe due to the continuously downscaling of microelectronic structures. The use of SRAM-based FPGAs for aerospace applications is viewed critically [1]-[3]. Autonomous driving and the expectatio...

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SEU,COTS,Radiation,Rad-Hard,Neutron,Simulation

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