Fully Microstrip Three-Port Circuit Bandpass NGD Design and Test

Blaise Ravelo,Alexandre Douyere,Yang Liu,Wenceslas Rahajandraibe,Fayu Wan,George Chan,Mathieu Guerin

IEEE design & test（2023）

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摘要

This article presents design and test of three-port distributed circuit exhibiting double bandpass (BP) negative group delay (NGD) effect.

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关键词

Integrated circuit modeling,Microstrip,Topology,Delays,Integrated circuit interconnections,RLC circuits,Mathematical models,Bandpass,Bandpass (BP) negative group delay (NGD),Modelling,Design and test,Three-port microstrip circuit,Transmission line (TL),Voltage transfer function (VTF)

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