TECED: A Two-Dimensional Error-Correction Codes Based Energy-Efficiency SRAM Design

The reliability of memory is an important issue. The rapid development of transistor technology makes the memory more prone to soft errors. Several recent efforts have proposed various designs to avoid the corruption of stored data by using Error Correction Codes (ECC). However, these designs tend to focus on one indicator, which means they cannot balance the electrical timing, area and power consumption constraints with the increasing of the chip-scale and the operating frequency. In this paper, we propose a design named TECED: A Two-Dimensional Error-Correction Codes Based Energy-Efficiency SRAM Design. We achieve higher energy-efficiency and lower hardware cost by using a two-dimensional error correction codes, and evaluate the design by considering the overall system performance. Comparing with the traditional Hamming code, the evaluation shows that the TECED reduces most of fifty percent of the area overhead and twenty-eight point five percent power consumption of the memory at a specific storage capacity.